The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2026
Filed:
Nov. 12, 2021
Merck Patent Gmbh, Darmstadt, DE;
Michaela Oberle, Darmstadt, DE;
Eric Schunda, Kronberg Im Taunus, DE;
Robert Fischer, Kronberg Im Taunus, DE;
MERCK PATENT GMBH, Darmstadt, DE;
Abstract
A method for evaluation of a thin-layer chromatography plate after performing a separation process that separates components of a sample on the thin-layer chromatography plate comprises a digitization step, wherein at least two digital images are taken that differ with respect to the wavelength range of illumination of the thin-layer chromatography plate. The method further comprises a position identification step wherein the position of the thin-layer chromatography plate is identified for each of the at least two digital images. Furthermore, the method comprises an evaluation step wherein an image information of the at least two digital images is superimposed for at least all regions with at least one visible spot within at least one of the at least two digital images, so that the superimposition of image information from identical regions of at least two digital images can be used for evaluation of the thin-layer chromatography.