The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2026
Filed:
Jun. 29, 2023
Applicant:
Samsung Display Co., Ltd., Yongin-si, KR;
Inventors:
Jeong Moon Lee, Yongin-si, KR;
Dae Hong Kim, Yongin-si, KR;
Assignee:
Samsung Display Co., Ltd., Yongin-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8851 (2013.01); G01N 21/8806 (2013.01); G01N 21/9501 (2013.01); G01N 2021/8809 (2013.01); G01N 2021/8874 (2013.01); G01N 2021/8887 (2013.01);
Abstract
A defect inspection device according to one or more embodiments includes an inspection device for detecting a defect by line-scanning an object, and for generating review image data for the defect, a height measurer for acquiring a reference height of the defect and a height of the defect, and for generating height data of the defect, and a defect classifier for classifying the defect based on the review image data and the height data.
Quick Actions:
Lee, Jeong. (2026). Defect inspection device and method for inspecting defect (U.S. Patent No. 12584865). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12584865
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