The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2026

Filed:

Oct. 17, 2023
Applicant:

Deere & Company, Moline, IL (US);

Inventors:

Peter Schade, Bad Dürkheim, DE;

Carsten Struve, Ladenburg, DE;

Renke Gralfs, Trippstadt, DE;

Assignee:

Deere & Company, Moline, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/3563 (2014.01); A01D 41/127 (2006.01); G01N 21/359 (2014.01); G01N 21/85 (2006.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3563 (2013.01); A01D 41/1277 (2013.01); G01N 21/359 (2013.01); G01N 33/0098 (2013.01); G01N 21/85 (2013.01); G01N 2021/8592 (2013.01); G01N 2201/1296 (2013.01);
Abstract

A method for measuring at least one of a mass-specific or size-specific variable of grain crops, the method comprising the following steps: recording a spectrum of the grain crops with a sensor operating in the near-infrared range; and deriving the at least one of mass-specific or size-specific variable from the spectrum.


Find Patent Forward Citations

Loading…