The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2026

Filed:

Mar. 15, 2024
Applicant:

Idexx Laboratories, Inc., Westbrook, ME (US);

Inventors:

Jennifer Cote, Westbrook, ME (US);

Kevin Chamberland, Westbrook, ME (US);

Murthy Yerramilli, Westbrook, ME (US);

Assignee:

IDEXX LABORATORIES, INC, Westbrook, ME (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2024.01); G01N 15/1434 (2024.01); G06V 10/14 (2022.01); G06V 10/44 (2022.01);
U.S. Cl.
CPC ...
G01N 15/1434 (2013.01); G06V 10/14 (2022.01); G06V 10/443 (2022.01);
Abstract

A system for analyzing a plurality of particles is disclosed. The system includes a platform structurally configured to support container, a reader, a shield, one or more processors, and a non-transitory, computer-readable medium storing instructions that, when executed by the one or more processors, cause the system to perform a set of operations comprising: analyzing, via the reader, a plurality of particles in the container, the plurality of particles comprising at least one paramagnetic, identifiable bead, in the container, wherein analyzing the plurality of particles comprises performing one or more assay procedures on the plurality of particles and, during the one or more assay procedures, determining a parameter of the plurality of particles.


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