The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2026
Filed:
Feb. 24, 2023
Kabushiki Kaisha Toshiba, Tokyo, JP;
Toshiba Energy Systems & Solutions Corporation, Kawasaki Kanagawa, JP;
Yasunori Taguchi, Kawasaki Kanagawa, JP;
Kouta Nakata, Tokyo, JP;
Susumu Naito, Yokohama Kanagawa, JP;
Yuichi Kato, Moriya Ibaraki, JP;
Shinya Tominaga, Yokohama Kanagawa, JP;
Naoyuki Takado, Tokyo, JP;
Ryota Miyake, Yokohama Kanagawa, JP;
Yusuke Terakado, Yokohama Kanagawa, JP;
Toshio Aoki, Tokyo, JP;
KABUSHIKI KAISHA TOSHIBA, Kawasaki, JP;
Toshiba Energy Systems & Solutions Corporation, Kawasaki, JP;
Abstract
According to one embodiment, an anomaly detection apparatus includes a processing circuit. The processing circuit is configured to: acquire measured values from sensors installed in a system, a first function, a first threshold, and a second function to output a second threshold; generate the predicted values based on the measured value and the first function; detect that a deviation between the measured values and the predicted values exceeds the first threshold; calculate the feature quantities based on the measured values; and determine whether a number of consecutive times is equal to or larger than the second threshold to detect an anomaly or a sign of the anomaly.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile