The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2026

Filed:

Sep. 17, 2021
Applicant:

Ntt, Inc., Tokyo, JP;

Inventor:

Shingo Ono, Musashino, JP;

Assignee:

NTT, Inc., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 11/00 (2006.01); G01M 11/02 (2006.01);
U.S. Cl.
CPC ...
G01M 11/331 (2013.01); G01M 11/0207 (2013.01); G01M 11/0264 (2013.01); G01M 11/333 (2013.01); G01M 11/335 (2013.01);
Abstract

A light intensity distribution pattern measurement device according to the present disclosure includes: a two-dimensional imaging sensor for receiving multiplexed light that is obtained by multiplexing transmitted light obtained by injecting one branched light of first continuous light into an optical fiber under measurement, reference light that is the other branched light of the first continuous light, and local light; and a signal processing unit for performing digital signal processing on a light reception signal I (t) of each pixel obtained by the two-dimensional imaging sensor, in which the signal processing unit measures a light intensity distribution pattern, by calculating a square of an autocorrelation function between the light reception signal I (t) and a light reception signal I (t+τ) obtained by shifting the light reception signal by time τ, for each pixel of the two-dimensional imaging sensor.


Find Patent Forward Citations

Ono, Shingo. (2026). Light intensity distribution pattern measuring device and method (U.S. Patent No. 12584818). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12584818

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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