The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2026

Filed:

Mar. 15, 2022
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Haruki Miyasaka, Matsumoto, JP;

Sho Aruga, Chino, JP;

Kenichi Shirota, Suwa, JP;

Juro Masaki, Shiojiri, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/26 (2006.01); G01J 3/02 (2006.01); G01J 3/46 (2006.01); G02B 5/28 (2006.01); G02B 7/00 (2021.01); G02B 26/00 (2006.01);
U.S. Cl.
CPC ...
G01J 3/26 (2013.01); G01J 3/0232 (2013.01); G01J 3/46 (2013.01); G02B 5/284 (2013.01); G02B 7/006 (2013.01); G02B 26/001 (2013.01);
Abstract

A color measurement apparatus includes a substrate including an optical filter that processes light arriving from a measurement target, a reduction portion that reduces a quantity of light heading toward the optical filter from the measurement target, a frame that is a frame arranged to face the substrate and to which the substrate is fixed, and has a shape avoiding the optical filter and in which the reduction portion is positioned at a position facing the optical filter, and a positioning section that decides a relative position between the substrate and the frame in a direction intersecting with a center axis of the reduction portion.


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