The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2026
Filed:
Nov. 13, 2017
Elbit Systems Ltd., Haifa, IL;
Elbit Systems Ltd., Haifa, IL;
Abstract
An inertial measurement system comprising at least one sensor cluster comprising a plurality of inertial sensors for sampling at least one of acceleration and angular velocity of said at least one sensor cluster with respect to each axis in a plurality of axes of a reference frame, and for producing individual outputs associated with said at least one of acceleration and angular velocity, at least three of said inertial sensors said sampling with respect to each same respective said axis; and a processing engine for receiving said individual outputs, combining said individual outputs to yield respective combined outputs, detecting which of said individual outputs diverges from at least one of their inter-comparison, and its respective combined output, according to a decision rule, said processing engine configured to dynamically self-calibrate a parameter that includes individual scale factor of those said inertial sensors whose said individual outputs were detected to diverge.