The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2026
Filed:
Jul. 27, 2023
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventors:
Toru Watanabe, Matsumoto, JP;
Hiroyuki Ogiso, Ina, JP;
Assignee:
SEIKO EPSON CORPORATION, , JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 19/5712 (2012.01); G01C 25/00 (2006.01); G01P 1/00 (2006.01); G01P 15/125 (2006.01); G01P 15/18 (2013.01);
U.S. Cl.
CPC ...
G01C 19/5712 (2013.01); G01C 25/00 (2013.01); G01P 1/00 (2013.01); G01P 15/125 (2013.01); G01P 15/18 (2013.01);
Abstract
An inertial measurement device includes: a substrate having a joining area; a cap; a sensor device accommodated in a resin package and disposed in a mounting area on the substrate in an internal space between the substrate and the cap; and a sealing material and a joining material configured to join the cap to the substrate in the joining area of the substrate. The joining material surrounds the mounting area and has a communication hole for communication between the internal space and the outside, and the sealing material closes the communication hole.