The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2026
Filed:
Sep. 12, 2022
Applicant:
Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;
Inventors:
Masaki Fukuda, Osaka, JP;
Toru Matsunobu, Osaka, JP;
Satoshi Yoshikawa, Hyogo, JP;
Kensho Teranishi, Osaka, JP;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G06T 7/12 (2017.01); G06T 7/13 (2017.01); G06T 7/62 (2017.01); G06T 17/00 (2006.01); G06V 10/44 (2022.01); G06V 10/74 (2022.01);
U.S. Cl.
CPC ...
G01B 11/02 (2013.01); G06T 7/12 (2017.01); G06T 7/13 (2017.01); G06T 7/62 (2017.01); G06T 17/00 (2013.01); G06V 10/44 (2022.01); G06V 10/761 (2022.01);
Abstract
A dimension measurement method includes: extracting a plurality of lines from a plurality of images generated by shooting a target area from a plurality of viewpoints, and generating a line segment model which is a three-dimensional model of the target area that is expressed using the plurality of lines; calculating a dimension of a particular part inside the target area, using the line segment model; and outputting the dimension calculated.