The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2026
Filed:
Aug. 21, 2023
Seiko Epson Corporation, Tokyo, JP;
Naoki Takatsu, Suwa, JP;
Hiromu Miyazawa, Azumino, JP;
Satoru Masai, Ina, JP;
Oshi Iwakami, Chino, JP;
Seiko Epson Corporation, Tokyo, JP;
Abstract
A calibration method includes acquiring medium information; specifying a type of medium by collating medium information with structure data; executing a first simulation of ejecting liquid by changing at least one of physical property conditions at least once for a structure model corresponding to a specified type of the medium; ejecting the liquid onto the medium; acquiring permeation information of the liquid ejected to the medium; estimating a physical property condition of the liquid by collating the permeation information with results of the first simulation; executing a second simulation of ejecting the liquid by changing at least one of ejection conditions at least once based on the estimated physical property condition; and displaying a plurality of virtual print results, which are virtual print results when printing is performed on the medium based on each of the ejection conditions, based on results of the second simulation.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile