logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12582317 B1

PDFFull Text
Date of Patent:
Mar. 24, 2026

Filed:

Feb. 24, 2023

Detecting device and measuring apparatus

Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventor:

Takefumi Fukagawa, Fujimi-machi, JP;

Assignee:

SEIKO EPSON CORPORATION, Tokyo, JP;

Attorney:

JCIPRNET

Primary Examiner:

Mark R Gaworecki

Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/02 (2006.01); A61B 5/021 (2006.01); A61B 5/1455 (2006.01); H10K 59/60 (2023.01); A61B 5/024 (2006.01); A61B 5/145 (2006.01); H10K 59/30 (2023.01);
U.S. Cl.
CPC ...
A61B 5/0059 (2013.01); A61B 5/02108 (2013.01); A61B 5/1455 (2013.01); H10K 59/60 (2023.02); A61B 5/02416 (2013.01); A61B 5/14532 (2013.01); A61B 5/14551 (2013.01); A61B 5/681 (2013.01); A61B 2562/0233 (2013.01); A61B 2562/046 (2013.01); G06F 2218/00 (2023.01); H10K 59/30 (2023.02);
Abstract

A detecting device includes a substrate and a plurality of detecting elements arranged in a matrix at the substrate. Each of the plurality of detecting elements includes a light emitting portion and a light receiving portion that receives light of a wavelength emitted from the light emitting portion at a position adjacent to the light emitting portion. The light receiving portion includes a photoelectric conversion portion formed at the substrate. The light emitting portion includes an organic EL light emitting element formed at the substrate. The area of the light receiving portion is larger than the area of the light emitting portion.

Find Patent Forward Citations

Fukagawa, Takefumi. (2026). Detecting device and measuring apparatus (U.S. Patent No. 12582317). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12582317

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…