The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2026

Filed:

Dec. 30, 2022
Applicant:

Topcon Corporation, Tokyo, JP;

Inventor:

Yoko Hirohara, Tokyo, JP;

Assignee:

TOPCON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/00 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); A61B 3/0091 (2013.01);
Abstract

An ophthalmic apparatus includes an objective lens, and an OCT optical system optical system is configured to project a measurement light onto a subject's left or right eye via an objective lens, and to detect interference light between returning light of the measurement light a reference light having traveled through a reference optical path. An optical axis switching member switches an optical axis of the OCT optical system to approximately coincide with a first or second measurement optical axis. A controller is configured to control the optical axis switching member. An intraocular parameter calculator calculates an intraocular parameter of the subject's left or right eye based on a detection result of the interference light acquired in a state where the optical axis of the OCT optical system is switched so that the optical axis of the OCT optical system approximately coincides with the first or second measurement optical axis.


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