The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2026
Filed:
Jun. 11, 2024
Applicant:
Sony Group Corporation, Tokyo, JP;
Inventor:
Hiroaki Takano, Saitama, JP;
Assignee:
SONY GROUP CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 72/23 (2023.01); H04W 16/32 (2009.01); H04W 24/02 (2009.01); H04W 24/08 (2009.01); H04W 52/24 (2009.01); H04W 52/34 (2009.01); H04W 72/044 (2023.01); H04W 72/0453 (2023.01); H04W 72/52 (2023.01); H04W 72/542 (2023.01);
U.S. Cl.
CPC ...
H04W 72/23 (2023.01); H04W 24/02 (2013.01); H04W 52/24 (2013.01); H04W 52/34 (2013.01); H04W 16/32 (2013.01); H04W 24/08 (2013.01); H04W 72/0453 (2013.01); H04W 72/046 (2013.01); H04W 72/52 (2023.01); H04W 72/542 (2023.01);
Abstract
An apparatus comprises processing circuitry configured to communicate with a base station using a millimeter-wave frequency band; receive a reference signal transmitted from the bases station; measure, based on the reference signal, a serving cell quality; and trigger a report in a case that a criterion for the serving cell quality is met. The criterion includes an offset value with a predetermined value for the millimeter-wave frequency band.