The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2026

Filed:

Oct. 27, 2023
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Xiaolong Chen, Nanjing, CN;

Yuming Xie, Nanjing, CN;

Xin Xiao, Nanjing, CN;

Yunpeng Gao, Nanjing, CN;

Dakun Li, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 41/0631 (2022.01);
U.S. Cl.
CPC ...
H04L 41/0631 (2013.01);
Abstract

This application discloses a network fault analysis method and apparatus. The method includes: obtaining information about a first abnormal event and information about a second abnormal event; determining first fault cause description information and second fault cause description information respectively based on the information about the first abnormal event and the information about the second abnormal event, where each of the first and the second fault cause description information is used to describe a cause of occurrence of a corresponding abnormal event; and determining, based on event identifiers in the information about the first and the second abnormal events, and the first and the second fault cause description information, that the first abnormal event corresponding to the first fault cause description information is a cause event that causes occurrence of the second abnormal event corresponding to the second fault cause description information.


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