The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2026
Filed:
May. 10, 2024
Gowin Semiconductor Corporation, GuangZhou, CN;
Qiang Zhou, GuangZhou, CN;
Ruixia Bai, GuangZhou, CN;
Xiaozhi Lin, GuangZhou, CN;
Qiming Wu, GuangZhou, CN;
Yu Sun, GuangZhou, CN;
Jia Ding, GuangZhou, CN;
Xu Ding, GuangZhou, CN;
GOWIN Semiconductor Corporation, GuangZhou, CN;
Abstract
A circuitry, method, computer storage medium, and terminal for deskew processing include: receiving data lanes, clock signal lanes, deskew control modules, and deskew modules. The receiving data lane receives input data signals, which are in alternating standard sequence. The clock signal lane receives input clock signals. The deskew control module is connected to the receiving data lane and is set to acquire the sample data obtained by sampling the data signal of the data signal lane by the clock signal of the clock signal lane with a preset duration, and determine the delay information based on the sample data. The deskew module is connected to the deskew control module and is set to adjust the phase offset of both the clock signal and the data signal based on the delay information. The embodiments of the present invention sample the data signal and determine the delay information by the deskew control module, adjust the phase offset by the delay information, simplifying the circuitry composition of phase calibration.