The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2026
Filed:
Nov. 01, 2023
Embedded coplanar waveguides for thin-film material characterization and methods related to the same
GM Global Technology Operations Llc, Detroit, MI (US);
The Ohio State University, Columbus, OH (US);
Alebel H. Arage, Lake Orion, MI (US);
Kubilay Sertel, Hilliard, OH (US);
Niru K. Nahar, Hilliard, OH (US);
Yagmur Ozturk, Columbus, OH (US);
Maruf Md. Sajjad Hossain, Columbus, OH (US);
GM Global Technology Operations LLC, Detroit, MI (US);
The Ohio State University, Columbus, OH (US);
Abstract
A thin-film material measurement and characterization fixture system using an embedded coplanar waveguide fixture including a substrate layer, an upper conductor layer disposed on top of the substrate layer, the upper conductor layer including a first upper conductor layer and a second upper conductor layer spaced from the first upper conductor layer by a gap, a signal trace disposed on top of the substrate layer in the gap between the first upper conductor layer and the second upper conductor layer, and a superstrate layer disposed on top of the upper conductor layer and the signal trace, the superstrate layer filling the gap between the first upper conductor layer and the second upper conductor layer to achieve accurate thin-film characterization in the millimeter wave bands.