The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2026

Filed:

Mar. 01, 2023
Applicants:

Shimadzu Corporation, Kyoto, JP;

National Institute of Health Sciences, Kawasaki, JP;

Inventors:

Yusuke Nakai, Kyoto, JP;

Eiichi Yamamoto, Ibaraki, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16C 20/10 (2019.01); G01N 33/15 (2006.01);
U.S. Cl.
CPC ...
G16C 20/10 (2019.02); G01N 33/15 (2013.01);
Abstract

A sample analysis device includes an acquirer that acquires quantitative measurement information (measurement data) of a plurality of substances including a test substance present in a sample, an estimator that retrieves a reaction model stored in a storage device, models the test substance using the reaction model and provides the quantitative measurement information (measurement data) of the plurality of substances to the reaction model of the test substance to estimate a parameter of the reaction model, and a calculator that calculates quantitative estimation information of the test substance in any period of time or information in regard to a period of time until quantitative estimation information of the test substance reaches a predetermined threshold value, based on the parameter estimated by the estimator.


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Nakai, Yusuke. (2026). Sample analysis device, sample analysis method, pharmaceutical analysis device and pharmaceutical analysis method (U.S. Patent No. 12580052). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12580052

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