The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2026

Filed:

Sep. 16, 2023
Applicant:

Doosan Enerbility Co., Ltd., Changwon, KR;

Inventors:

Jun Sang Yu, Seongnam, KR;

Jung Min Lee, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/50 (2022.01); G06T 7/00 (2017.01); G06V 10/75 (2022.01); G06V 10/762 (2022.01); G06V 10/77 (2022.01); G06V 10/774 (2022.01); G06V 10/776 (2022.01);
U.S. Cl.
CPC ...
G06V 20/50 (2022.01); G06T 7/001 (2013.01); G06V 10/751 (2022.01); G06V 10/762 (2022.01); G06V 10/7715 (2022.01); G06V 10/774 (2022.01); G06V 10/776 (2022.01); G06T 2207/20021 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30108 (2013.01);
Abstract

Disclosed is a degradation prediction device predicting a lifetime of a target material, including: at least one processor, and the at least one processor is configured to train a degradation index prediction model based on the representative value of a degradation index of a material by environmental conditions and the environmental information of a material subjected to a destructive testing, train a LMP (Larson-Miller Parameter) value prediction model based on the representative value of a degradation index of a material by environmental conditions and a theoretical value of LMP at a destructive testing, predict a degradation index for a target material using the degradation index prediction model for which training is completed based on environmental information of the target material and predict a LMP value of the target material using the LMP value prediction model for which training is completed based on the predicted degradation index.


Find Patent Forward Citations

Yu, Jun. (2026). Device and method for degradation prediction (U.S. Patent No. 12579811). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12579811

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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