The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2026

Filed:

Mar. 31, 2022
Applicant:

1finity Inc., Kawasaki, JP;

Inventors:

Nannan Wang, Allen, TX (US);

XI Wang, Murphy, TX (US);

Ladan S. Pickering, Plano, TX (US);

Paparao Palacharla, Richardson, TX (US);

Mauricio Martinez, Plano, TX (US);

Darryl Ellis Whitlock, Carrollton, TX (US);

Assignee:

1FINITY Inc., Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); G06V 10/74 (2022.01);
U.S. Cl.
CPC ...
G06T 7/74 (2017.01); G06V 10/761 (2022.01); G06T 2207/20084 (2013.01); G06V 2201/07 (2022.01);
Abstract

A method may include obtaining a first image of a first view. The first illustrated by the first image may be defined by one or more viewing parameters. The method may also include acquiring, from a machine learning system, a location of an object within the first image, calculating a relative position of the object within the first image using the location of the object within the first image, and determining whether the relative position of the object satisfies a condition. In response to the relative position of the object not satisfying the condition, at least one of the viewing parameters may be adjusted based on the relative position of the object and the condition. The method may further include obtaining a second image of a second view. The second view illustrated by the second image may be defined by the adjusted at least one of the viewing parameters.


Find Patent Forward Citations

Loading…