The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2026
Filed:
Dec. 18, 2023
Leica Geosystems Ag, Heerbrugg, CH;
Gregory Walsh, Walnut Creek, CA (US);
Krishnendu Shekhar, San Ramon, CA (US);
LEICA GEOSYSTEMS AG, Heerbrugg, CH;
Abstract
A method may include obtaining three-dimensional coordinate points and a two-dimensional image representing an environment and objects in the environment. The method may include segmenting the image into image segments and obtaining a pixel selection in the image. The method may include generating an image segment frustum corresponding to a particular image segment shape that includes the pixel. The method may include intersecting the image segment frustum with the coordinate points to determine a subset of the three-dimensional coordinates used to fit a derived surface. The derived surface may represent a three-dimensional volume having a surface shape corresponding to the shape of the image segment frustum and may include a subset of three-dimensional coordinate points that intersects with the image segment frustum. The method may include generating a derived three-dimensional coordinate point that represents a surface point included in the environment within a volume of the derived surface.