The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2026

Filed:

Feb. 19, 2021
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Hayato Itsumi, Tokyo, JP;

Takanori Iwai, Tokyo, JP;

Yusuke Shinohara, Tokyo, JP;

Florian Beye, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 7/215 (2017.01); H04N 21/2343 (2011.01); H04N 21/44 (2011.01);
U.S. Cl.
CPC ...
G06T 7/215 (2017.01); H04N 21/234381 (2013.01); H04N 21/44008 (2013.01); G06T 2210/12 (2013.01);
Abstract

A video analysis apparatus and the like with improved video analysis accuracy are provided. The video analysis apparatus includes a first video analysis unit and a second video analysis unit. The first video analysis unit is configured to distribute frames to the first video analysis unit or the second video analysis unit, detect a target object in frames which are distributed to be analyzed in the first video analysis unit, and acquire information on movement associated with the detected target object, and transmitting the information on the movement and a detection result in the first detection unit to the second video analysis unit. The second video analysis unit is configured to detect a target object in frames from the distribution unit, and adjust the detection result of the first detection unit based on a detection result in the second detection unit and the information on the movement.


Find Patent Forward Citations

Loading…