The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2026
Filed:
Dec. 08, 2023
Crefle Inc., Gyeonggi-do, KR;
Eunseok Seo, Seoul, KR;
CREFLE Inc., Seongnam-si, KR;
Abstract
An artificial intelligence-based process defect detection system may include: a photographing module that collects image data by capturing a process that progresses on an object; a machine learning model that generates work data that is a result of recognizing and reading the object based on the image data; and a detection module that receives instruction data recorded regarding a process for an object optimized for product production, detects a defect or a non-defect by comparing the work data with the instruction data, and generates defect information when the process is defective.
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