The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2026

Filed:

Apr. 13, 2022
Applicant:

Optum, Inc., Minnetonka, MN (US);

Inventor:

Shyam Charan Mallena, Telangana, IN;

Assignee:

Optum, Inc., Minnetonka, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 5/04 (2023.01); G06N 5/02 (2023.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G06N 5/027 (2013.01);
Abstract

Various embodiments of the present invention address technical challenges associated with performing machine learning operations on timeseries/periodic data by introducing a machine learning framework that has a first periodic tier for determining predicted evaluation scores for those predictive entities that are associated with a single evaluation period (e.g., a single year of data) and a second periodic tier for determining predicted evaluation scores for those predictive entities that are associated with multiple evaluation periods. The noted framework addresses the existing shortcomings of machine learning frameworks that operate on timeseries/periodic data with respect to inadequacy of data associated with shorter periods to determine parameters needed to perform comprehensive predictive data analysis with respect to longer periods.


Find Patent Forward Citations

Mallena, Shyam. (2026). Evaluation score determination machine learning models with differential periodic tiers (U.S. Patent No. 12579452). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12579452

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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