The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2026

Filed:

May. 24, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Tianwei Xing, Santa Clara, CA (US);

Wenjun Jiang, San Jose, CA (US);

Xun Chen, Fremont, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/27 (2020.01); G06F 119/14 (2020.01);
U.S. Cl.
CPC ...
G06F 30/27 (2020.01); G06F 2119/14 (2020.01);
Abstract

An electronic device may be provided to perform collision analysis. The electronic device may be configured to: receive sensor data from an inertial-measuring-unit (IMU) sensor; detect that a collision event has occurred based on the sensor data and detect collision data from the sensor data; input the collision data into a collision classification model that is trained to predict a collision material type and a collision intensity of the collision event; and determine an action to be performed by the electronic device based on the collision material type and the collision intensity of the collision event.


Find Patent Forward Citations

Xing, Tianwei. (2026). Apparatus and method for performing collision analysis (U.S. Patent No. 12579346). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12579346

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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