The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2026
Filed:
May. 27, 2021
China Intelligent and Connected Vehicles (Beijing) Research Institute Co., Ltd., Beijing, CN;
Tsinghua University, Beijing, CN;
Wenbo Chu, Beijing, CN;
Keqiang Li, Beijing, CN;
Shuang Wan, Beijing, CN;
Dalong Fang, Beijing, CN;
Guanfu Huang, Beijing, CN;
Xiaoping Du, Beijing, CN;
CHINA INTELLIGENT AND CONNECTED VEHICLES (BEIJING) RESEARCH INSTITUTE CO., LTD., Beijing, CN;
Tsinghua University, Beijing, CN;
Abstract
A method for determining test evaluation information includes: building a hardware-in-the-loop test environment, wherein the hardware-in-the-loop test environment comprises a cloud control platform under test, a road traffic scenario simulation platform, and a real-time simulator, and wherein the road traffic scenario simulation platform is configured to build a variety of road traffic scenarios, the real-time simulator is configured to realize communication between the cloud control platform under test and respective interface boards; determining a test scenario according to a function to be realized by the cloud control platform under test; performing a test operation on the cloud control platform under test based on the hardware-in-the-loop test environment and the test scenario, and collecting functional parameters of the cloud control platform under test; and determining test evaluation information of the cloud control platform under test based on the functional parameters.