The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2026

Filed:

Mar. 07, 2023
Applicant:

Harness Inc., San Francisco, CA (US);

Inventors:

Patricio Echague, Redwood City, CA (US);

Joshua Sirota, Redwood City, CA (US);

Robert Grassian, San Mateo, CA (US);

Assignee:

Harness Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 13/00 (2006.01); G06F 9/44 (2018.01); G06F 11/3604 (2025.01); G06F 16/28 (2019.01);
U.S. Cl.
CPC ...
G06F 11/3616 (2013.01);
Abstract

Methods and systems for providing a feature data platform for providing feature level context data for a configurable application are describe. The method can include receiving, from an application developer system, an audit log associated with a configurable application, the configurable application comprising a set of feature flags that configure the configurable application during execution of the application, the audit log providing a definition of a format of feature flag impression messages generated by the configurable application. The method can also include receiving, from the configurable application, a feature flag impression message that indicates a configuration of the set of feature flags to which a user of the application was exposed to during execution of the application. Furthermore, the method can include translating the feature flag impression message into a common format of a feature data platform based on the definition of the format of the feature flag impression messages, and storing the translated feature flag impression message in a data store.


Find Patent Forward Citations

Echague, Patricio. (2026). Systems and methods for a feature data platform (U.S. Patent No. 12579051). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12579051

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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