The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2026
Filed:
Aug. 11, 2022
Fujifilm Business Innovation Corp., Tokyo, JP;
FUJIFILM BUSINESS INNOVATION CORP., Tokyo, JP;
Abstract
A printed material inspection system includes a processor configured to inspect a quality of a printed material; and a display that displays a result of the inspection. The processor is configured to: by reading and executing a program, compare a scanned image obtained by scanning an inspection target page of the printed material, out of pages forming a job, with a reference image created based on rasterize data of the inspection target page and perform an inspection of whether or not a first defect is present in the scanned image at a first inspection level, which is a preset initial level or a level set by a user; automatically perform an inspection of whether or not a second defect is present in the scanned image at a second inspection level that is different from the first inspection level; and display the first defect and the second defect on the display in such a manner that the first defect and the second defect are able to be distinguished from each other.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile