The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2026

Filed:

Apr. 01, 2024
Applicant:

Konica Minolta, Inc., Tokyo, JP;

Inventors:

Yasuhiro Okamoto, Tokyo, JP;

Hisanori Kawashima, Tokyo, JP;

Ryo Minegishi, Tokyo, JP;

Shunsuke Takamura, Tokyo, JP;

Takashi Ohta, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08B 21/00 (2006.01); G01N 21/3518 (2014.01); G05B 19/042 (2006.01); G06T 7/00 (2017.01); G06T 7/90 (2017.01);
U.S. Cl.
CPC ...
G05B 19/0425 (2013.01); G01N 21/3518 (2013.01); G06T 7/0004 (2013.01); G06T 7/90 (2017.01);
Abstract

An inspection support method on inspection of a gas or petroleum-related production facility, by receiving registration of producer information on a producer that owns or manages the production facility, receiving registration of production facility information on the production facility, receiving registration of inspector information on each of a plurality of inspector candidates that are candidates to inspect the production facility, acquiring the registered production facility information on the production facility, acquiring the registered inspector candidate information on the inspector candidate, and outputting inspection-related information containing inspection schedule information on a schedule of inspection of the production facility by the inspector candidate, based on the acquired production facility information and the acquired inspector candidate information.


Find Patent Forward Citations

Okamoto, Yasuhiro. (2026). Inspection support method, inspection support apparatus, and inspection support program (U.S. Patent No. 12578698). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12578698

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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