The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2026

Filed:

Oct. 29, 2021
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Jeronimo Segovia-Fernandez, San Jose, CA (US);

Corina Nistorica, San Jose, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 1/00 (2006.01); H10N 30/30 (2023.01); H10N 30/50 (2023.01); H10N 30/85 (2023.01); H10N 30/87 (2023.01);
U.S. Cl.
CPC ...
G02B 1/002 (2013.01); H10N 30/302 (2023.02); H10N 30/50 (2023.02); H10N 30/85 (2023.02); H10N 30/877 (2023.02);
Abstract

An optical detector system includes a light source configured to emit light having a frequency spectrum and modulated in time, and an optical detector configured to detect an intensity of the light at a wavelength range within the frequency spectrum. The optical detector includes a piezoelectric layer, a first metal layer coupled to a first surface of the piezoelectric layer, a second metal layer coupled to a second surface of the piezoelectric layer, and a plasmonic metasurface coupled to the first metal layer and configured to absorb the light at the wavelength range, the plasmonic metasurface including metal structures and a dielectric layer disposed on the first metal layer. The optical detector system further includes a voltage detector coupled to the first metal layer and the second metal layer, the voltage detector configured to detect a voltage at a frequency of the modulated light.


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