The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2026

Filed:

Jul. 17, 2020
Applicant:

Proceq SA, Schwerzenbach, CH;

Inventors:

Samuel Lehner, Zürich, CH;

Antonio Caballero, Volketswil, CH;

Assignee:

PROCEQ SA, Schwerzenbach, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/38 (2006.01); G01S 7/40 (2006.01); G01S 13/02 (2006.01);
U.S. Cl.
CPC ...
G01S 13/38 (2013.01); G01S 7/40 (2013.01); G01S 13/0209 (2013.01);
Abstract

A method and a device for probing a subsurface structure. The method includes sending an electromagnetic wave into the structure, receiving an echo of the electromagnetic wave from the structure and processing the echo for deriving an internal feature of the structure. The sending the electromagnetic wave into the structure includes subsequently sending a plurality of electromagnetic probe signals with differing frequency spectra into the structure. Each probe signal includes at least two non-zero spectral components. The receiving the echo includes receiving an echo signal for each probe signal. The processing the echo includes determining at least one amplitude and phase for each echo signal.


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