The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2026
Filed:
Feb. 27, 2023
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Assignee:
SHIMADZU CORPORATION, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/86 (2006.01); G01N 30/72 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G01N 30/8624 (2013.01); G01N 30/72 (2013.01); G06N 20/00 (2019.01);
Abstract
An analysis device produces learning data for training an estimation model. More specifically, the analysis device obtains a plurality of reference waveforms. In addition, the analysis device specifies information about a peak for each of the plurality of reference waveforms according to a certain criterion. The analysis device assigns the specified information about the peak to each of the plurality of reference waveforms.
Kanazawa, Shinji. (2026). Learning data producing method, waveform analysis device, waveform analysis method, and recording medium (U.S. Patent No. 12578317). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12578317
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