The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2026

Filed:

Dec. 04, 2020
Applicant:

Saint-gobain Glass France, Courbevoie, FR;

Inventors:

Daouda Keita Diop, Clichy, FR;

Adrien Carlu, Amiens, FR;

Théo Rybarczyk, Margny les Compiegne, FR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/958 (2006.01); G01J 9/02 (2006.01); G01M 11/02 (2006.01);
U.S. Cl.
CPC ...
G01N 21/958 (2013.01); G01J 9/02 (2013.01); G01M 11/0228 (2013.01); G01M 11/0264 (2013.01); G01M 11/0271 (2013.01); G01M 11/0278 (2013.01); G01N 2021/9586 (2013.01);
Abstract

A method for measuring the optical quality of a given region of a glazing of a road or rail vehicle, the region being intended to be positioned in the optical path of an image-acquiring device, the measuring method being implemented by a measuring device including an emitter and a wavefront analyzer, the measuring method including emitting, with the emitter, a beam of light rays in the direction of the given region, analyzing, with the wavefront analyzer, the wavefront of the light rays transmitted by the given region, including generating a wavefront-error map, and determining, on the basis of the wavefront-error map, at least one optical-defect map, of any optical defects present in the region of the glazing.


Find Patent Forward Citations

Diop, Daouda. (2026). Method for measuring the optical quality of a given region of a glazing unit, associated measuring device (U.S. Patent No. 12578287). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12578287

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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