The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2026

Filed:

Apr. 04, 2022
Applicant:

Impossible Sensing Llc, St. Louis, MO (US);

Inventors:

Pablo Sobron, St. Louis, MO (US);

Kirby H. Simon, St. Louis, MO (US);

Daniel C. Van Hoesen, St. Louis, MO (US);

Owen M. Pochettino, St. Louis, MO (US);

Assignee:

Impossible Sensing LLC, St. Louis, MO (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/71 (2006.01); G01N 21/39 (2006.01);
U.S. Cl.
CPC ...
G01N 21/718 (2013.01); G01N 21/39 (2013.01); G01N 2201/0612 (2013.01); G01N 2223/401 (2013.01); G01N 2223/402 (2013.01);
Abstract

Provided herein is a system and method for elemental abundance monitoring used in ore exploration, mining and processing comprising an optical assembly of sensing elements combined with computer vision techniques for 3-dimensional mapping and optical focusing to identify and map elemental concentrations. Elements are identified using a custom Laser Induced Breakdown Spectroscopy (LIBS) technique where a traditional detector is replaced by a series of photodiodes tuned for specific wavelengths, indicative of the desired element(s). The optical system may be combined with a computer vision architecture to focus the optics by determining the 3-dimensional profile of the material to preserve sensor-sample optical path and geometry, a requirement for quantitative measurements of elemental abundances. The system may be employed in a dynamic system (such as a conveyor belt) where material is analyzed in real-time as it passes a scanner. Alternatively, the system can be used in a static condition without sample movement.


Find Patent Forward Citations

Sobron, Pablo. (2026). Method and system for mapping elemental composition in dynamic and heterogenous material (U.S. Patent No. 12578276). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12578276

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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