The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2026
Filed:
Dec. 21, 2023
Endress+hauser Optical Analysis, Inc., Ann Arbor, MI (US);
Justin Moretto, Apex, NC (US);
Endress+Hauser Optical Analysis, Inc., Ann Arbor, MI (US);
Abstract
A measuring head and a measurement apparatus comprising a measuring head for performing surface-enhanced Raman spectroscopic measurements. The measuring head comprises a housing, an optical device including a window closing off an opening of the housing and a prism extending into the interior of the housing, and a SERS-substrate disposed on an outer side of the measuring head. The SERS-substrate includes a nanostructured layer and a chemically inert, transparent passivation layer. The optical device is evanescently coupled to the SERS-substrate and configured to receive excitation light transmitted to the optical device through the housing, to refract the excitation light towards the SERS-substrate such that an evanescent field extends from the SERS-substrate into a medium adjacent an outside surface of the passivation layer, and to receive Raman scattered light emanating from the medium through the SERS-substrate and to direct the Raman scattered light through the housing.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile