The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2026
Filed:
Dec. 02, 2021
Agilent Technologies, Inc., Santa Clara, CA (US);
Ross Marcel Piette, Santa Clara, CA (US);
Xavier Francois Patrick Amouretti, Santa Clara, CA (US);
Caleb Alan Foster, Santa Clara, CA (US);
Benjamin Jon Knight, Santa Clara, CA (US);
Peter Brent Knox, Santa Clara, CA (US);
Ben Edward Norris, Santa Clara, CA (US);
James Donald Piette, Santa Clara, CA (US);
Richard Niles Sears, Santa Clara, CA (US);
Matthew Arthur Stiles, Santa Clara, CA (US);
Oleg Nikolaevich Zimenkov, Santa Clara, CA (US);
AGILENT TECHNOLOGIES, INC., Santa Clara, CA (US);
Abstract
An apparatus for optically analyzing a sample may include an imaging subsystem that images the sample, one or more analyzing subsystems that analyze the sample including a confocal imaging subsystem, a temperature control subsystem that controls a temperature of the atmosphere within the apparatus, a gas control subsystem that controls a composition of the atmosphere within the apparatus, and a control module that controls the various subsystems of the apparatus.