The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2026

Filed:

Dec. 20, 2022
Applicant:

Endress+hauser Conducta Gmbh+co. KG, Gerlingen, DE;

Inventors:

Felicia Seichter, Ludwigsburg, DE;

Andreas Bayer, Gerlingen, DE;

Thilo Krätschmer, Gerlingen, DE;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/27 (2006.01); G01N 21/31 (2006.01);
U.S. Cl.
CPC ...
G01N 21/31 (2013.01); G01N 21/274 (2013.01); G01N 2021/3188 (2013.01); G01N 2021/3196 (2013.01);
Abstract

A preparation method for preparing spectrometric determinations of a measurand in a target application using a spectrometer is provided. On the basis of reference data recorded in the target application, a normalized measurand master spectrum with a spectral distribution characteristic of the measurand is determined. On the basis of the measurand master spectrum, synthetic spectra are generated which cover a value range greater than or equal to a value range covered by the reference values. On the basis of the synthetic spectra, information for carrying out the spectrometric determinations, including information comprising a property, a wavelength range, and/or a path length range for an optical path length suitable for carrying out the spectrometric determinations, and/or comprising a calculation rule, with which, on the basis of measurement spectra in the target application, measured values of the measurand are determined.


Find Patent Forward Citations

Loading…