The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2026

Filed:

Jan. 15, 2025
Applicant:

Fluke Corporation, Everett, WA (US);

Inventors:

Guofeng Che, Beijing, CN;

Xugang Chen, Shanghai, CN;

Yan Yuan, Shanghai, CN;

Assignee:

Fluke Corporation, Everett, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2022.01); G01J 5/03 (2022.01); G01J 5/48 (2022.01); G01S 15/10 (2006.01); G01J 5/00 (2022.01);
U.S. Cl.
CPC ...
G01J 5/0275 (2013.01); G01J 5/0265 (2013.01); G01J 5/03 (2022.01); G01J 5/48 (2013.01); G01S 15/10 (2013.01); G01J 2005/0077 (2013.01);
Abstract

The present disclosure provides a thermal imaging system that uses the 3D ultrasound imaging system to transmit outgoing ultrasonic waves and receive incoming ultrasonic waves and then to determine distance data of one or more objects of a target scene based on the incoming waves. The thermal imaging system then detects initial temperature values of the one or more objects using an infrared temperature system. Based on the distance data and the initial temperature values, the thermal imaging system determines adjusted temperature values for the one or more objects.


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