The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2026

Filed:

Jun. 26, 2023
Applicant:

The Regents of the University of Colorado, a Body Corporate, Denver, CO (US);

Inventors:

Gregory B. Rieker, Boulder, CO (US);

Caroline B. Alden, Boulder, CO (US);

Robert J. Wright, Boulder, CO (US);

Sean C. Coburn, Longmont, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/453 (2006.01); G01N 21/27 (2006.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
G01J 3/4531 (2013.01); G01N 21/274 (2013.01); G01J 2003/2866 (2013.01); G01J 2003/4538 (2013.01);
Abstract

A method for adaptive dual frequency-comb spectroscopy includes repeatedly (i) recording a single interferogram with a dual frequency-comb spectrometer, (ii) averaging the single interferogram into an averaged interferogram, and (iii) determining a signal-to-noise ratio (SNR) of the averaged interferogram, until the SNR of the averaged interferogram exceeds a SNR threshold. In certain embodiments, determining the SNR includes determining a signal amplitude of a center burst of the averaged interferogram and determining a noise level of the averaged interferogram from data points of the averaged interferogram located away from the center burst. In certain embodiments, determining the SNR includes Fourier transforming the averaged interferogram into a frequency spectrum and numerically integrating the frequency spectrum.


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