The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2026
Filed:
Oct. 02, 2020
A&d Company, Limited, Tokyo, JP;
Kazuna Okabe, Saitama, JP;
Yoshikazu Nagane, Saitama, JP;
A&D COMPANY, LIMITED, Tokyo, JP;
Abstract
Provided is a weighing apparatus and a method capable of quantifying a failure risk based on an impact load and proposing an inspection content according to an impact. In order to achieve the object described above, a weighing apparatus includes a weighing sensor, an impact load quantifying unit configured to quantify an impact load from an acceleration of a load transmitting unit configured to transmit a load of a weighing object to the weighing sensor, and a failure risk level calculating unit configured to calculate an impact level based on a numerical value of the impact load, and calculate a failure risk level from the number of detections of the impact level in a predetermined period of time from past to present and a weighting coefficient according to the impact level.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile