The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2026
Filed:
Dec. 23, 2019
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Ayaka Hori, Kyoto, JP;
Shin Nakamura, Kyoto, JP;
Satoshi Yomota, Kyoto, JP;
Nobuyuki Akinaga, Kyoto, JP;
Assignee:
SHIMADZU CORPORATION, Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/1455 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/14553 (2013.01); A61B 5/0042 (2013.01); A61B 5/0059 (2013.01); A61B 5/6814 (2013.01);
Abstract
A probe unit () of this optical measurement device () includes a base member () rotatable about a central axis (), a light-transmitting probe () and a light-receiving probe () protruding in a first direction from the base member, and a plurality of pin members () for parting hairs, the plurality of pin members protruding in the first direction from the base member. The plurality of pin members is inclined obliquely at least either in a direction toward a central axis side of the base member or in a circumferential direction about the central axis of the base member.