The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2026

Filed:

Sep. 06, 2022
Applicant:

Deere & Company, Moline, IL (US);

Inventors:

Mahesh Somarowthu, Pune, IN;

Noel W. Anderson, Fargo, ND (US);

Assignee:

DEERE & COMPANY, Moline, IL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A01D 41/127 (2006.01); G01N 21/3563 (2014.01); G01N 21/3581 (2014.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
A01D 41/1277 (2013.01); G01N 21/3563 (2013.01); G01N 21/3581 (2013.01); G01N 33/0098 (2013.01);
Abstract

A terahertz frequency-based sensing system for an agricultural harvester is provided. The system includes a terahertz sensor mounted to the agricultural harvester. The terahertz sensor at least one a terahertz source disposed to direct electromagnetic radiation toward a harvest material of the agricultural harvester. At least one terahertz detector is disposed to detect the terahertz electromagnetic radiation after the terahertz electromagnetic radiation interacts with the harvest material. A controller is operably coupled to the at least one terahertz detector and is configured to detect at least one harvest-related parameter based on a signal from the at least one terahertz detector and to perform an action based on the at least one detected parameter.


Find Patent Forward Citations

Somarowthu, Mahesh. (2026). System and method for terahertz frequency crop contamination detection and handling (U.S. Patent No. 12575496). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12575496

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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