The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2026

Filed:

Feb. 28, 2024
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Tomoyuki Kawai, Saitama, JP;

Shinichi Shimotsu, Saitama, JP;

Tetsuya Fujikawa, Saitama, JP;

Tomoharu Shimada, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/52 (2023.01); H04N 23/20 (2023.01); H04N 23/60 (2023.01);
U.S. Cl.
CPC ...
H04N 23/52 (2023.01); H04N 23/20 (2023.01); H04N 23/60 (2023.01);
Abstract

Provided are an imaging apparatus and a control method of the imaging apparatus which are for reducing noise included in an output image of an imaging element having a photosensitive layer on a silicon substrate. An imaging apparatus (-) includes an imaging element () having a photosensitive layer on a silicon substrate, a cooling unit () that cools the imaging element (), a temperature detection unit () that detects a temperature of the imaging element (), and a CPU () functioning as a processor, in which the processor () controls the cooling unit () based on a first frame rate at which the imaging element is driven () and the temperature of the imaging element () detected by the temperature detection unit ().


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