The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2026

Filed:

Aug. 07, 2024
Applicant:

Silicon Laboratories Inc., Austin, TX (US);

Inventors:

Guner Arslan, Austin, TX (US);

Yi Shen Yeh, Austin, TX (US);

Assignee:

Silicon Laboratories Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 25/03 (2006.01); H04L 1/00 (2006.01);
U.S. Cl.
CPC ...
H04L 25/03178 (2013.01); H04L 1/0013 (2013.01);
Abstract

In one embodiment, a method includes: generating, in a baseband processor of a receiver, a random correlation sequence; determining a first number of a first type of a predetermined tuple pattern present in the random correlation sequence, and determining a second number of a second type of the predetermined tuple pattern present in the random correlation sequence; and based at least in part on the first and second numbers, puncturing a bit of the random correlation sequence.


Find Patent Forward Citations

Arslan, Guner. (2026). Puncturing a correlation sequence used in high accuracy distance measurements (U.S. Patent No. 12574269). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12574269

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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