The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2026

Filed:

Jun. 27, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Yeonwook Jung, Suwon-si, KR;

Myeongwoo Lee, Suwon-si, KR;

Jongchul Park, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/40 (2006.01); G11C 11/4093 (2006.01); G11C 11/4094 (2006.01);
U.S. Cl.
CPC ...
G11C 11/4093 (2013.01); G11C 11/4094 (2013.01);
Abstract

In a method of testing a nonvolatile memory device including a first semiconductor layer in which and a second semiconductor layer formed prior to the first semiconductor layer, circuit elements including a page buffer circuit and at least one driver spaced apart from the page buffer circuit are provided in the second semiconductor layer, an on-state of nonvolatile memory cells which are not connected to the page buffer circuit is mimicked by providing at least one discharging path between a sensing node and a plurality of discharge transistors of the at least one driver, a sensing and latching operation with the on-state being mimicked is performed in the page buffer circuit and whether the page buffer circuit operates normally is determined based on a result of the sensing and latching operation.


Find Patent Forward Citations

Loading…