The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2026

Filed:

Jun. 27, 2022
Applicant:

Sharp Kabushiki Kaisha, Sakai City, JP;

Inventors:

Naoki Shiobara, Sakai City, JP;

Masafumi Ueno, Sakai City, JP;

Masaaki Moriya, Sakai City, JP;

Masafumi Kawai, Sakai City, JP;

Mohammad Reza Kazemi, Sakai City, JP;

Hiroyuki Furukawa, Sakai City, JP;

Assignee:

SHARP KABUSHIKI KAISHA, Sakai City, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/3233 (2016.01); G09G 3/00 (2006.01);
U.S. Cl.
CPC ...
G09G 3/3233 (2013.01); G09G 3/006 (2013.01); G09G 2300/0819 (2013.01); G09G 2300/0842 (2013.01); G09G 2300/0861 (2013.01); G09G 2320/02 (2013.01); G09G 2320/041 (2013.01); G09G 2320/045 (2013.01); G09G 2360/145 (2013.01);
Abstract

A control device for a display panel includes a plurality of pixels each including: a self-luminous element; and a transistor that controls a current that flows through the self-luminous element, the control device including: a measuring unit configured to measure a luminescence characteristic of the self-luminous element and an operating characteristic of the transistor; and a correction unit configured to correct an input video signal that enables identifying a video to be displayed on the display panel, based on luminescence data related to the luminescence characteristic and operation data related to the operating characteristic, wherein the measuring unit measures the luminescence characteristic at a frequency that is lower than a frequency at which the measuring unit measures the operating characteristic.


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