The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2026
Filed:
Nov. 17, 2021
Nec Corporation, Tokyo, JP;
Ryusuke Imai, Tokyo, JP;
Akira Tsuji, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
An abnormality determination method capable of contributing to improvement of abnormality determination accuracy is implemented. The abnormality determination method according to an example embodiment of the present disclosure includes: setting a first area for an optical fiber sensor to attempt to detect an abnormality; setting a second area in which detection of an abnormality is invalidated when the abnormality is detected in the first area; setting an invalid time zone in which detection of an abnormality is invalidated when the abnormality is detected in the first area; and determining, when an abnormality is detected in the first area, that no abnormality has occurred in the first area in a case where a position where the abnormality is detected is inside the second area and a time when the abnormality is detected is within the invalid time zone.