The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2026
Filed:
Sep. 23, 2020
Applicant:
Nec Corporation, Tokyo, JP;
Inventors:
Hiroshi Hashimoto, Tokyo, JP;
Akihiro Hayasaka, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 40/16 (2022.01); G06V 10/774 (2022.01);
U.S. Cl.
CPC ...
G06V 40/161 (2022.01); G06V 10/774 (2022.01);
Abstract
A feature point is detected from a face region of a person reflected in an image. A specific area in which the person's face is not covered with an outfitting member is determined in the face region. Collation is performed using the feature point in the specific area.
Hashimoto, Hiroshi. (2026). Comparison device, comparison method, and program (U.S. Patent No. 12573233). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12573233
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile