The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2026

Filed:

Dec. 22, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Shigeaki Namiki, Tokyo, JP;

Shoji Yachida, Tokyo, JP;

Toshinori Hosoi, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/774 (2022.01); G06V 10/44 (2022.01); G06V 10/764 (2022.01); G06V 10/98 (2022.01);
U.S. Cl.
CPC ...
G06V 10/774 (2022.01); G06V 10/44 (2022.01); G06V 10/764 (2022.01); G06V 10/98 (2022.01);
Abstract

A data acquisition means acquires source domain data and target domain data. An alignment means performs an alignment which converts the source domain data and the target domain data into images of a predetermined reference angle. A feature extraction means extracts local features of the source domain data and the target domain data. A classification means classifies a class based on the local features of the source domain data and the target domain data after the alignment. A learning means trains the feature extraction means based on the local features of the source domain data and the target domain data after the alignment and a classification result of the class.


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