The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2026
Filed:
Jun. 21, 2023
Insight Direct Usa, Inc., Chandler, AZ (US);
Scott Joynt, Delaware, OH (US);
Insight Direct USA, Inc., Chandler, AZ (US);
Abstract
A method of collecting and conditioning image data of an item for use in training a machine-learning model to detect at least one defect can include capturing a first set of images by a first camera with each image of the first set of images having a first viewpoint of the item that is the same viewpoint as the other images in the first set of images and can be illuminated by various wavelengths of light including ultraviolet light, infrared light, and visible light. The method can further include examining one image of the first set of images to determine if the item contains at least one defect, identifying a first location of the at least one defect on the one image, designating the first location on the other images of the first set of images so that all images in the first set of images identify the first location.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile